Included will be the various functional blocks in the CPU, typical scan techniques, I/ O interface and memory uses, power supplies, and system diagnostics. 在这整个系统中,包括CPU的各种各样的功能模块,典型的扫瞄技术,I/O接口和应用存储器、电源和系统诊断。
Additionally, stress conditions were tested by metal magnetic memory method in order to execute early diagnostics of the inspection object before each X-ray diffraction tested. 为准确找到测点位置并寻求两种方法之间关系,在每次应力测试之前,均用金属磁记忆方法进行了先期检测。